DFT commonly stands for Design for Testability. Design for Testability is an approach in electronic design that focuses on designing integrated circuits (ICs) in such a way that it becomes easier to test and diagnose faults or defects during the manufacturing and testing phase.
The goal of DFT in VLSI is to improve the testability of integrated circuits, reduce the time and cost of testing, and enhance the overall quality and reliability of the manufactured chips. Incorporating DFT techniques into the design process is crucial for addressing the challenges posed by the complexity of modern VLSI circuits.
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Physical design refers to the process of transforming a logical circuit description.
DFT commonly stands for Design for Testability. Design for Testability.
STA stands for Static Timing Analysis. It is a crucial step in the design.
Physical Verification in the context of VLSI (Very Large Scale Integration).
Power analysis refers to the study and analysis of the power distribution network in an integrated circuit (IC).
Functional verification is a crucial step in the design and development of integrated circuits (ICs) within the field of VLSI (Very Large Scale Integration).
Analog layout in VLSI (Very Large Scale Integration) refers to the physical arrangement and placement of analog circuit components on the semiconductor die.